Tuesday, June 08, 2010
Traqu measures in 3-D with nanometer precision
3-D: Digitize First, Measure Later
Traqu, the new 3-D measurement system from Essemtec, delivers more than traditional AOI systems can. Featuring an infrared interferometer, it creates a digital 3-D model of an object with an accuracy of a nanometer. Using this innovative model, any type of measurement can be made later, including volume, height, distance, surface roughness and more. The measuring principle works with any kind of surface, reflective or matte.
The Traqu is scanning the surface of an object in 3-D. Therefore, all measurements and analysis can be made on the digital model at a later date and even in a different location.
Users can freely define any required measurements. For example, the Traqu can analyze the surface profile along a given line, calculate volumes, determine distances or even measure the surface roughness in a given area. The device also can determine layer thickness because an interferometer works very similar to an ultrasound probe. The scanner can resolve details down to nanometer resolution.
Because of its flexibility and independence, Traqu is ideal for analysis and documentation in the development process, for tasks in quality control or for inspection of incoming goods. The measurement system works extremely quickly, up to a million frames per second.
The 3-D scanner is mounted on a precise XY portal and can digitize surfaces up to 400 x 300 mm. Therefore, it can scan complete a PCB at once, even with components on it. There are no shadows, parallax errors or damages because the scanning beam is vertical and low energy.
Traqu is a universal measuring system with high flexibility and easy-to-use software. It can inspect all types of products and materials, but also can be specialized for a single, customer-specific purpose.